EMIF02-SPK02F2 View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
'EMIF02-SPK02F2' PDF : 12 Pages View PDF
Characteristics
Figure 6. ESD test conditions
EMIF02-SPK02F2
2 x -20 dB
50 Ω input
Figure 7.
Clamping voltage VCL versus peak pulse current IPP for short pulse duration such as
ESD surges
IPP (A)
40
35
Typical breakdown dynamic resistance RD: 140 mΩ
tP = 100 ns
30
TJ initial = 25 °C
25
)
(AIPP20
15
10
5
V CL (V)
0
0
2
4
6
8
10
12
14
16
VCL(V)
Note:
For further information on the dynamic characteristic see the STMicroelectronics’
application note AN4022, “TVS short pulse Rd measurement and correlation with TVS
clamping voltage during ESD”.
4/12
Doc ID 15035 Rev 3
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