Test Conditions
Device Under Test
CL
EN29LV160J
3.3 V
2.7 kΩ
6.2 kΩ
Note: Diodes are IN3064 or equivalent
Test Specifications
Test Conditions
Output Load
Output Load Capacitance, CL
Input Rise and Fall times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
-55
-70
-90
Unit
1 TTL Gate
30
100
100
pF
5
20
20
ns
0.0-0.3 0.45-2.4 0.45-2.4
V
1.5
0.8, 0.7 x 0.8, 0.7 x
Vcc
Vcc
V
1.5
0.8, 0.7 x 0.8, 0.7 x
Vcc
Vcc
V
4800 Great America Parkway, Suite 202
27
Santa Clara, CA 95054
Rev 0.3 Release Date: 2002/01/30
Tel: 408-235-8680
Fax: 408-235-8685