LH28F008SCB-L12 View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
'LH28F008SCB-L12' PDF : 55 Pages View PDF
sharp
LHF08CH1
30
Sym.
VCC=5V±0.5V, 5V±0.25V, TA=0°C to +70°C
VCC=5V±0.25V LH28F008SC-L85(5)
Versions(4)
VCC=5V±0.5V
Parameter
Notes Min.
Max.
LH28F008SC-L90(6)
Min.
Max.
Unit
tAVAV Read Cycle Time
85
90
ns
tAVQV Address to Output Delay
85
90
ns
tELQV CE# to Output Delay
2
85
90
ns
tPHQV RP# High to Output Delay
400
400
ns
tGLQV OE# to Output Delay
2
40
45
ns
tELQX CE# to Output in Low Z
3
0
0
ns
tEHQZ CE# High to Output in High Z
3
55
55
ns
tGLQX OE# to Output in Low Z
3
0
0
ns
tGHQZ OE# High to Output in High Z
3
10
10
ns
tOH
Output Hold from Address, CE# or OE#
Change, Whichever Occurs First
3
0
0
ns
NOTES:
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling edge of CE# without impact on tELQV.
3. Sampled, not 100% tested.
4. See Ordering Information for device speeds (valid operational combinations).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard
Configuration) for testing characteristics.
Rev. 1.3
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