LH28F016SUT-70 View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
'LH28F016SUT-70' PDF : 37 Pages View PDF
16M (1M × 16, 2M × 8) Flash Memory
LH28F016SU
Capacitance
For 3.3 V Systems
SYMBOL
PARAMETER
TYP. MAX. UNITS
TEST CONDITIONS
NOTE
CIN
Capacitance Looking into an
Address/Control Pin
6
8
pF TA = 25°C, f = 1.0 MHz
1
COUT Capacitance Looking into an Output Pin
8
12
pF TA = 25°C, f = 1.0 MHz
1
CLOAD
Load Capacitance Driven by Outputs for
Timing Specifications
50
pF For VCC = 3.3 V ±0.3 V
1
Equivalent Testing Load Circuit
2.5
ns 50 Ω transmission line delay
Capacitance
For 5.0 V Systems
SYMBOL
PARAMETER
TYP. MAX. UNITS
TEST CONDITIONS
NOTE
CIN
Capacitance Looking into an
Address/Control Pin
6
8
pF TA = 25°C, f = 1.0 MHz
1
COUT Capacitance Looking into an Output Pin
8
12
pF TA = 25°C, f = 1.0 MHz
1
CLOAD
Load Capacitance Driven by Outputs for
Timing Specifications
100
pF For VCC = 5.0 V ±0.5 V
1
Equivalent Testing Load Circuit VCC ± 10%
Equivalent Testing Load Circuit VCC ± 5%
2.5
ns 25 Ω transmission line delay
2.5
ns 83 Ω transmission line delay
NOTE:
1. Sampled, not 100% tested.
15
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