LPC1769 View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
MFG CO.
'LPC1769' PDF : 79 Pages View PDF
NXP Semiconductors
LPC1769/68/67/66/65/64/63
32-bit ARM Cortex-M3 microcontroller
Table 19. ADC characteristics (lower resolution)
Tamb = −40 °C to +85 °C unless otherwise specified; 12-bit ADC used as 10-bit resolution ADC.
Symbol Parameter
Conditions
Min Typ
ED
EL(adj)
EO
EG
differential linearity error
integral non-linearity
offset error
gain error
[1][2] -
[3] -
[4] -
[5] -
±1
±1.5
±2
±2
fclk(ADC) ADC clock frequency
3.0 V ≤ VDDA ≤ 3.6 V
-
-
fc(ADC)
ADC conversion frequency
2.7 V ≤ VDDA < 3.0 V
3 V ≤ VDDA ≤ 3.6 V
2.7 V ≤ VDDA < 3.0 V
-
-
[6] -
-
[6] -
-
Max
-
-
-
-
33
25
500
400
Unit
LSB
LSB
LSB
LSB
MHz
MHz
kHz
kHz
[1] The ADC is monotonic, there are no missing codes.
[2] The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 26.
[3] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 26.
[4] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 26.
[5] The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 26.
[6] The conversion frequency corresponds to the number of samples per second.
LPC1769_68_67_66_65_64_63
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 5 April 2011
© NXP B.V. 2011. All rights reserved.
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