LTC2970/LTC2970-1
U
OPERATIO
Procedure:
Update the over-voltage limit register with the value above
which the ADC result should generate an over-voltage fault.
Instantaneous over-voltage faults are updated after each
ADC conversion. They are asserted high when the ADC
result is greater than the over-voltage limit. They are cleared
if the ADC result is less than or equal to the over-voltage
limit. Setting the over-voltage limit to 14’h3fff inhibits
instantaneous faults for the associated channel.
Update the under-voltage limit register with the value below
which the ADC result should generate an under-voltage
fault. Instantaneous under-voltage faults are updated
after each ADC conversion. They are asserted high when
the ADC result is less than the under-voltage limit. They
are cleared if the ADC result is greater than or equal to
the under-voltage limit. Setting the over-voltage limit to
14’h4000 inhibits instantaneous faults for the associated
channel.
Update ADC_MON() control bits to allow ADC conversions
on all channels that are to be monitored for over and under
voltage limits. Instantaneous IDAC faults are polled after
all ADC conversions are completed and set when the as-
sociated IDAC registers are at ‘h00 of ‘hff.
Read FAULT() to view the value of all instantaneous
faults.
The IO(Io_cfg_0) command may be used to configure
the GPIO_0 pin to output the internal Power_good flag.
Power_good is asserted high if there are no instantaneous
over-voltage or under-voltage faults. IO() may be used to
read the value of Power_good through io_gpio_0.
The IO(Io_cfg_1) command may be used to configure the
GPIO_1 pin to output the internal Idac_fault flag. Idac_fault
is asserted high if either IDAC value is faulted. IO() may be
used to read the value of Idac_fault through io_gpio_1.
Rules:
The over-voltage and under-voltage limits must be initial-
ized; they do not have a default value.
All over-voltage limits, under-voltage limits and ADC re-
sults use 2’s complement notation with bit position [14]
of register [14:0] being used for the sign.
Instantaneous Ch0_a and Ch1_a faults may be used to
trigger a servo on fault event.
Over-voltage and under-voltage faults require that the
associated ADC_MON control bit be asserted high for
instantaneous fault detection to be updated.
17. Generating and Monitoring Latched Faults
The LTC2970 is able to selectively latch instantaneous faults
in the latched fault register FAULT_LA. Each instantaneous
fault has an associated latched fault bit in FAULT_LA and
a fault enable bit in FAULT_EN; (see Table 8) for details.
When an instantaneous fault enable bit is high, any event
that sets the instantaneous fault will simultaneously set
the latched fault. The latched fault will remain set even if
conditions permit the instantaneous fault to be cleared.
The latched faults are immediately cleared whenever the
associated fault enable bit is cleared. All latched faults are
also cleared when the latched fault register is read over
FAULT_LA().
The FAULT_INDEX() command may be read to determine
if any latched faults are asserted. Reading FAULT_INDEX()
does not clear latched faults. The ALERT output may also
be configured to view whether any latched faults are as-
serted.
Procedure:
Follow procedure for generating instantaneous faults.
Write FAULT_EN() to enable any combination of latched
faults.
Read FAULT_INDEX() to determine if any latched faults
are asserted without clearing latched faults.
Read FAULT_LA() to monitor all latched faults. Reading
FAULT_LA() will clear all latched faults. These will remain
clear until the next time the LTC2970 polls and sets an
associated instantaneous fault.
Setting IO(Io_alert_enb) low will cause ALERT to be as-
serted low whenever any one of the fourteen latched faults
is asserted high. The value of the ALERT pin may also be
read through IO(Alertb).
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