Qdatasheet_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

MC9S12E128MFC View Datasheet(PDF) - Motorola => Freescale

Part Name
Description
MFG CO.
MC9S12E128MFC
Motorola
Motorola => Freescale Motorola
'MC9S12E128MFC' PDF : 156 Pages View PDF
Device User Guide — 9S12E12F8rDeGeV1s/DcVa0l1e.04Semiconductor, Inc.
B.5.1.4 Mass Erase
Erasing a NVM block takes:
tmass
20000
----------1-----------
fNVMOP
The setup times can be ignored for this operation.
B.5.1.5 Blank Check
The time it takes to perform a blank check on the Flash is dependant on the location of the first non-blank
word starting at relative address zero. It takes one bus cycle per word to verify plus a setup of the
command.
tcheck location tcyc + 10 tcyc
Table B-5 NVM Timing Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol Min Typ Max Unit
1
D External Oscillator Clock
fNVMOSC
0.5
501
MHz
2
D Bus frequency for Programming or Erase Operations fNVMBUS
1
MHz
3
D Operating Frequency
fNVMOP
150
200
kHz
4
P Single Word Programming Time
tswpgm
462
74.53
µs
5
D Flash Burst Programming consecutive word
tbwpgm
20.42
313
µs
6
D Flash Burst Programming Time for 32 Words
tbrpgm
678.42
1035.53 µs
7
P Sector Erase Time
tera
204
26.73
ms
8
P Mass Erase Time
tmass
1004
1333
ms
9
D Blank Check Time Flash per block
t check
115
327786 tcyc
NOTES:
1. Restrictions for oscillator in crystal mode apply!
2. Minimum Programming times are achieved under maximum NVM operating frequency f NVMOP and maximum bus frequen-
cy fbus.
3. Maximum Erase and Programming times are achieved under particular combinations of f NVMOP and bus frequency f bus.
Refer to formulae in Sections A.3.1.1 - A.3.1.4 for guidance.
4. Minimum Erase times are achieved under maximum NVM operating frequency f NVMOP.
5. Minimum time, if first word in the array is not blank
6. Maximum time to complete check on an erased block.
B.5.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
130
For More Information On This Product,
Go to: www.freescale.com
Share Link: GO URL

All Rights Reserved © qdatasheet.com  [ Privacy Policy ] [ Contact Us ]