MC9S12E128MFC View Datasheet(PDF) - Motorola => Freescale
Part Name
Description
MFG CO.
'MC9S12E128MFC' PDF : 156 Pages View PDF
Freescale SemiconDdevuiccetUoserr,GIunidce.— 9S12E128DGV1/D V01.04
The failure rates for data retention and program/erase cycling are specified at <2ppm defects over lifetime
at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
NOTE: All values shown in Table B-6 are target values and subject to further extensive
characterization.
Table B-6 NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Data Retention at an average junction temperature of
1
C TJavg = 85°C
2
C Data Retention at a junction temperature of TJ =
140°C
3
C Flash number of Program/Erase cycles
Symbol
tNVMRET
tNVMRET
nFLPE
Min
15
10
10,000
Typ
Max Unit
Years
Years
Cycles
131
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