2Mb
SMART 5 BOOT BLOCK FLASH MEMORY
AC TEST CONDITION 1
AC TEST CONDITION 2
Input pulse levels ............................................... 0.4V to 2.4V
Input pulse levels ..................................................... 0V to 3V
Input rise and fall times ................................................ <10ns
Input rise and fall times ................................................ <10ns
Input timing reference level ............................... 0.8V and 2V
Input timing reference level ........................................... 1.5V
Output timing reference level ........................... 0.8V and 2V
Output timing reference level ....................................... 1.5V
Output load ................................. 1 TTL gate and CL = 100pF
Output load ................................... 1 TTL gate and CL = 50pF
, , VIH
, , , A0-A16/(A17)
, VIL
WORD-WIDE READ CYCLE1, 2
VALID ADDRESS
tRC
tAA
VIH
CE#
VIL
tACE
VIH
OE#
VIL
VIH
WE# VIL
VIH
DQ0-DQ15
VIL
VIH
RP# VIL
tRWH
tAOE
TIMING PARAMETERS
Commercial Temperature (0°C ≤ TA ≤ +70°C)
Extended Temperature (-40°C ≤ TA ≤ +85°C)
SYMBOL
tRC3
tRC4
tACE3
tACE4
tAOE3
tAOE4
tAA3
-6
MIN MAX
70
60
70
60
35
30
70
-8
MIN MAX
80
–
80
–
40
–
80
-8 ET
MIN MAX
80
–
80
–
40
–
80
UNITS
ns
ns
ns
ns
ns
ns
ns
VALID DATA
,,tOD
tOH
, DON’T CARE
,,,UNDEFINED
SYMBOL
tAA4
tRWH3
tRWH4
tOD3
tOD4
tOH3
tOH4
-6
MIN MAX
60
500
500
20
15
0
0
-8
MIN MAX
–
500
–
20
–
0
–
-8 ET
MIN MAX
–
500
–
20
–
0
–
UNITS
ns
ns
ns
ns
ns
ns
ns
NOTE: 1. BYTE# = HIGH (MT28F200B5 only).
2. Applies to MT28F200B5 only.
3. Measurements tested under AC Test Condition 1, VCC = 5V ±10%.
4. Measurements tested under AC Test Condition 2, VCC = 5V ±5%.
2Mb Smart 5 Boot Block Flash Memory
F50.p65 – Rev. 1/00
21
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2000, Micron Technology, Inc.