ST18AU1_DS View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
'ST18AU1_DS' PDF : 87 Pages View PDF
ST18-AU1
14 JTAG IEEE 1149.1 TEST ACCESS PORT
The Test Access Port (TAP) conforms to IEEE standard 1149.1.
The TAP consists of five pins: TMS, TCK, TDI, TDO and TRST. TDO can be overdriven to the
power rails, and TCK can be stopped in either logic state.
The instruction register is 8 bits long, with no parity, and the pattern “00000001” is loaded into
the register during the Capture-IR state.
There are three defined public instructions, see Table 14.1. All other instruction codes are
reserved.
Table 14.1 Instruction codes
Instruction code1)
04h
08h
FFh
Instruction
IDCODE
EMU
BYPASS
Selected register
Identification
D950 IOscan
Bypass
1)
MSB... LSB; LSB closest to TDO
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