Electrical characteristics
STM32F373xx
Table 63. DAC characteristics (continued)
Symbol
Parameter
Conditions
Min Typ
Max
Offset error
-
--
±10
Offset(3)
(difference between
Given for the DAC in 10-bit at VREF+ =
measured value at Code 3.6 V
-
-
±3
(0x800) and the ideal
value = VREF+/2)
Given for the DAC in 12-bit at VREF+ =
3.6 V
-
-
±12
Gain
error(3)
Gain error
Given for the DAC in 12bit
configuration
--
±0.5
Settling time (full scale:
for a 10-bit input code
transition between the
tSETTLING(3) lowest and the highest
input codes when
DAC_OUT reaches final
value ±1LSB
CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ
-3
4
Update
rate(3)
Max frequency for a
correct DAC_OUT
change when small
variation in the input code
(from code i to i+1LSB)
CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ
--
1
tWAKEUP(3)
Wakeup time from off
state (Setting the ENx bit
in the DAC Control
register)
CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ
input code between lowest and highest
possible ones.
-
6.5
10
PSRR+ (1)
Power supply rejection
ratio (to VDDA) (static DC No RLOAD, CLOAD = 50 pF
measurement
- -67
-40
1. Guaranteed by design.
2. Quiescent mode refers to the state of the DAC keeping a steady value on the output, so no dynamic consumption is
involved.
3. Guaranteed by characterization.
Unit
mV
LSB
LSB
%
µs
MS/s
µs
dB
Figure 29. 12-bit buffered /non-buffered DAC
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DLD
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
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