THBT7011D View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
'THBT7011D' PDF : 8 Pages View PDF
TEST CIRCUIT 2 for IH parameter.
THBT7011D
R
VBAT = - 48 V
D.U.T.
- VP
Surge generator
This is a GO-NOGO test which allows to confirm the holding current (IH) level in a functional
test circuit.
TEST PROCEDURE :
1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs.
3) The D.U.T will come back off-state within 50 ms max.
TEST CIRCUIT 3 for IPP and VBO parameters :
(VP is defined in no load condition)
L
R2
VP
C1
R1
R4
R3
C2
TIP
R ING
G ND
Pulse (µs)
tr
tp
Vp
C1
C2
L
R1
R2
R3
R4
IPP
Rp
(V) (µF) (nF) (µH) (Ω) (Ω) (Ω) (Ω) (A) (Ω)
10 700 1500 20 200
0
50
15
25
25
30
10
1.2 50 1500 1
33
0
76
13
25
25
30
10
2
10 2500 10
0
1.1 1.3
0
3
3
38
62
5/8
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