ADSP-21477 View Datasheet(PDF) - Analog Devices
Part Name
Description
MFG CO.
'ADSP-21477' PDF : 76 Pages View PDF
ADSP-21477/ADSP-21478/ADSP-21479
Table 15. Dynamic Current in CCLK Domain—IDD_INT_DYNAMIC (mA, with ASF = 1.0)1, 2
fCCLK (MHz)
100
1.05 V
75
1.10 V
78
1.15 V
82
Voltage (VDD_INT)
1.20 V
1.25 V
86
90
1.30 V
95
1.35 V
98
150
111
117
122
128
134
141
146
200
N/A
N/A
162
170
178
186
194
266
N/A
N/A
215
225
234
246
256
300
N/A
N/A
N/A
N/A
264
279
291
1 The values are not guaranteed as standalone maximum specifications. They must be combined with static current per the equations of Electrical Characteristics on Page 22.
2 Valid frequency and voltage ranges are model-specific. See Operating Conditions on Page 21.
MAXIMUM POWER DISSIPATION
See Engineer-to-Engineer Note “Estimating Power Dissipation
for ADSP-2147x SHARC Processors” for detailed thermal and
power information regarding maximum power dissipation. For
information on package thermal specifications, see Thermal
Characteristics on Page 66.
PACKAGE INFORMATION
The information presented in Figure 4 provides details about
the package branding. For a complete listing of product avail-
ability, see Ordering Guide on Page 76.
a
ADSP-2147x
tppZ-cc
vvvvvv.x n.n
#yyww country_of_origin
S
Figure 4. Typical Package Brand
Table 16. Package Brand Information1
Brand Key
Field Description
t
Temperature Range
pp
Package Type
Z
RoHS Compliant Option
cc
See Ordering Guide
vvvvvv.x
Assembly Lot Code
n.n
Silicon Revision
#
RoHS Compliant Designation
yyww
Date Code
1 Nonautomotive only. For branding information specific to automotive products,
contact Analog Devices Inc.
ESD SENSITIVITY
ESD (electrostatic discharge) sensitive device.
Charged devices and circuit boards can discharge
without detection. Although this product features
patented or proprietary protection circuitry, damage
may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to
avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS
Stresses greater than those listed in Table 17 may cause perma-
nent damage to the device. These are stress ratings only;
functional operation of the device at these or any other condi-
tions greater than those indicated in Operating Conditions on
Page 21 is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Table 17. Absolute Maximum Ratings
Parameter
Internal (Core) Supply Voltage (VDD_INT)
External (I/O) Supply Voltage (VDD_EXT)
Real Time Clock Voltage (VDD_RTC)
Thermal Diode Supply Voltage (VDD_THD)
Input Voltage
Output Voltage Swing
Storage Temperature Range
Junction Temperature While Biased
Rating
–0.3 V to +1.35 V
–0.3 V to +4.6 V
–0.3 V to +4.6 V
–0.3 V to +4.6 V
–0.5 V to +3.8 V
–0.5 V to VDD_EXT +0.5 V
–65°C to +150°C
125°C
Rev. C | Page 24 of 76 | July 2013
Share Link: 
