LH28F040SUTD-Z4 View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
'LH28F040SUTD-Z4' PDF : 32 Pages View PDF
4M (512K Ă— 8) Flash Memory
LH28F040SUTD-Z4
ELECTRICAL SPECIFICATIONS
Absolute Maximum Ratings*
Temperature under bias ...................... -20°C to +80°C
Storage temperature ......................... -65°C to +125°C
*WARNING: Stressing the device beyond the “Abso-
lute Maximum Ratings” may cause permanent dam-
age. These are stress ratings only. Operation beyond
the “Operating Conditions” is not recommended and
extended exposure beyond the “Operating Conditions”
may affect device reliability.
SYMBOL
PARAMETER
MIN.
MAX.
UNITS TEST CONDITIONS NOTE
TA Operating Temperature, Commercial
0
70.0
°C Ambient Temperature 1
VCC VCC with Respect to GND
-0.2
7.0
V
2
VPP VPP Supply Voltage with Respect to GND -0.2
7.0
V
2
V
Voltage on any Pin (Except VCC, VPP)
with Respect to GND
-0.5 VCC + 0.5
V
2
I
Current into any Non-Supply Pin
±30
mA
IOUT Output Short Circuit Current
100.0
mA
3
NOTES:
1. Operating temperature is for commercial product defined by this specification.
2. Minimum DC voltage is -0.5 V on input/output pins. During transitions, this level may undershoot to -2.0 V for periods < 20 ns. Maximum
DC voltage on input/output pins is VCC + 0.5 V which, during transitions, may overshoot to VCC + 2.0 V for periods < 20 ns.
3. Output shorted for no more than one second. No more than one output shorted at a time.
Capacitance
SYMBOL
PARAMETER
TYP. MAX. UNITS
TEST CONDITIONS
NOTE
CIN
Capacitance Looking into an
Address/Control Pin
14
20
pF TA = 25°C, f = 1.0 MHz
1, 2
COUT Capacitance Looking into an Output Pin
18
24
pF TA = 25°C, f = 1.0 MHz
1
CLOAD
Load Capacitance Driven by Outputs for
Timing Specifications
50
pF For VCC = 3.3 V ±0.3 V
1
Equivalent Testing Load Circuit VCC ± 10%
2.5
ns 50 Ω transmission line delay
NOTE:
1. Sampled, not 100% tested.
2. BE »0 and BE »1 have half the value of this.
19
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