LPC1767 View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
MFG CO.
'LPC1767' PDF : 79 Pages View PDF
NXP Semiconductors
LPC1769/68/67/66/65/64/63
32-bit ARM Cortex-M3 microcontroller
Table 7. Static characteristics …continued
Tamb = −40 °C to +85 °C, unless otherwise specified.
Symbol
Parameter
Conditions
I2C-bus pins (P0[27] and P0[28])
VIH
HIGH-level input
voltage
VIL
LOW-level input voltage
Vhys
hysteresis voltage
VOL
LOW-level output
IOLS = 3 mA
voltage
ILI
input leakage current
Oscillator pins
VI = VDD(3V3)
VI = 5 V
Vi(XTAL1)
input voltage on pin
XTAL1
Vo(XTAL2)
output voltage on pin
XTAL2
Vi(RTCX1)
input voltage on pin
RTCX1
Vo(RTCX2)
output voltage on pin
RTCX2
USB pins (LPC1769/68/66/65/64 only)
IOZ
OFF-state output
0 V < VI < 3.3 V
current
VBUS
VDI
bus supply voltage
differential input
sensitivity voltage
|(D+) − (D−)|
VCM
differential common
includes VDI range
mode voltage range
Vth(rs)se
single-ended receiver
switching threshold
voltage
VOL
LOW-level output
RL of 1.5 kΩ to 3.6 V
voltage for
low-/full-speed
VOH
HIGH-level output
RL of 15 kΩ to GND
voltage (driven) for
low-/full-speed
Ctrans
ZDRV
transceiver capacitance pin to GND
driver output
impedance for driver
which is not high-speed
capable
with 33 Ω series resistor;
steady state drive
Min
Typ[1]
0.7VDD(3V3) -
-
-
-
0.05 ×
VDD(3V3)
-
-
[21] -
2
-
10
−0.5
1.8
−0.5
1.8
−0.5
-
−0.5
-
[2] -
-
[2] -
-
[2] 0.2
-
[2] 0.8
-
[2] 0.8
-
[2] -
-
[2] 2.8
-
[2] -
-
[22][2] 36
-
Max
Unit
-
V
0.3VDD(3V3) V
-
V
0.4
V
4
μA
22
μA
1.95
V
1.95
V
3.6
V
3.6
V
±10
μA
5.25
V
-
V
2.5
V
2.0
V
0.18
V
3.5
V
20
pF
44.1
Ω
[1] Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply voltages.
[2] For USB operation 3.0 V ≤ VDD((3V3) ≤ 3.6 V. Guaranteed by design.
[3] The RTC typically fails when Vi(VBAT) drops below 1.6 V.
[4] VDD(REG)(3V3) = 3.3 V; Tamb = 25 °C for all power consumption measurements.
LPC1769_68_67_66_65_64_63
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 5 April 2011
© NXP B.V. 2011. All rights reserved.
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