M36W108T, M36W108B
Table 23. SRAM Low VCC Data Retention Characteristics (1, 2)
(TA = 0 to 70 °C; VCCS = 2.7 V to 3.6 V)
Symbol
Parameter
Test Condition
Min
ICCDR
Supply Current (Data Retention)
VCCS = 3V, E1S ≥ VCCS – 0.2V,
E2S ≥ VCCS – 0.2V or E2S ≤ 0.2V, f = 0
VDR Supply Voltage (Data Retention) E1S ≥ VCCS – 0.2V,E2S ≤ 0.2V, f = 0
2
tCDR Chip Disable to Power Down
E1S ≥ VCCS – 0.2V,E2S ≤ 0.2V, f = 0
0
tR
Operation Recovery Time
5
Note: 1. All other Inputs VIH ≤ VCC – 0.2V or VIL ≤ 0.2V.
2. Sampled only. Not 100% tested.
Max
20
3.6
Unit
µA
V
ns
ms
Figure 20. SRAM Low VCC Data Retention AC Waveforms, E1S Controlled
VCCS
2.7 V
2.2 V
VDR
E1S VSS
tCDR
DATA RETENTION MODE
tR
E1S ≥ VCCS – 0.2V
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