M39208
Table 13. Read AC Characteristics
(TA = 0 to 70°C or –20 to 85°C or –40 to 85°C; VCC = 2.7 V to 3.6V)
Symbol Alt
Parameter
Test Condition
-100
M39208
-120
-150
Unit
Min Max Min Max Min Max
tAVAV
tRC
Address Valid to Next
Address Valid
tAVQV
tACC
Address Valid to
Output Valid
tELQX (1)
tLZ
Chip Enable Low to
Output Transition
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL),
G = VIL
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL),
G = VIL
G = VIL
100
120
150
ns
100
120
150 ns
0
0
0
ns
tELQV (2)
tCE
Chip Enable Low to
Output Valid
G = VIL
100
120
150 ns
tGLQX (1)
tGLQV (2)
tEHQX
tOLZ
Output Enable Low to
Output Transition
tOE
Output Enable Low to
Output Valid
tOH
Chip Enable High to
Output Transition
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
G = VIL
0
0
0
ns
40
55
55 ns
0
0
0
ns
tEHQZ (1)
tHZ
Chip Enable High to
Output Hi-Z
G = VIL
30
40
40 ns
tGHQX
tGHQZ (1)
tOH
Output Enable High to
Output Transition
tDF
Output Enable High to
Output Hi-Z
tAXQX
tOH
Address Transition to
Output Transition
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL),
G = VIL
0
0
0
ns
30
40
40 ns
0
0
0
ns
tEHFL
tCED
EE (EF) Active to EF
(EE)
100
100
100
ns
Notes: 1. Sampled only, not 100% tested.
2. G may be delayed by up to tELQV - tGLQV after the falling edge of EE (or EF) without increasing tELQV.
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