MC9S12DG128 View Datasheet(PDF) - Freescale Semiconductor
Part Name
Description
MFG CO.
'MC9S12DG128' PDF : 142 Pages View PDF
Device User Guide — 9S12DT128DGV2/D V02.16
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
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