PCF7936AS View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
MFG CO.
'PCF7936AS' PDF : 33 Pages View PDF
NXP Semiconductors
Security Transponder (HITAG2)
Product Specification
PCF7936AS
11 TEST SETUP
Device characteristics are measured according to the test
setups given below.
Electrical characteristics are measured in a Helmholtz
arrangement that generates an almost homogenous
magnetic field at the position of the device under test
(transponder), see Figure 29.
The sense coils detect the absorption modulation induced
by the transponder, whereas the reference coils sense the
magnetic flux generated by the field generating coils only.
The voltage difference measured between the sense coils
and reference coils is proportional to the magnetic field
absorption induced by the transponder.
FMAX
DUT
Figure 28. Mechanical Stress
Reference Coils
(serial connected, in phase)
Signal
~
Generator
DUT
VDIF
Reference Coils
(serial connected, in phase)
Figure 29. Helmholtz setup for electrical characteristics
2010 May 04
30
CONFIDENTIAL
Share Link: 
