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RC28F800C3TC70 View Datasheet(PDF) - Intel

Part Name
Description
MFG CO.
'RC28F800C3TC70' PDF : 68 Pages View PDF
Intel£ Advanced+ Boot Block Flash Memory (C3)
8.5
AC I/O Test Conditions
Figure 11. AC Input/Output Reference Waveform
VCCQ
Input
0V
VCCQ/2
Test Points
VCCQ/2 Output
NOTE: Input timing begins, and output timing ends, at VCCQ/2. Input rise and fall times (10% to 90%) < 5 ns.
Worst case speed conditions are when VCC = VCCMin.
Figure 12. Transient Equivalent Testing Load Circuit
Device
Under Test
VCCQ
R1
Out
CL
R2
NOTE: See Table 17 for component values.
Table 23. Test Configuration Component Values for Worst Case Speed Conditions
Test Configuration
VCCQMin Standard Test
NOTE: CL includes jig capacitance.
CL (pF)
50
R1 (k)
25
R2 (k)
25
8.6
Device Capacitance
TA = 25 °C, f = 1 MHz
Symbol
Parameter§
CIN
Input Capacitance
COUT
Output Capacitance
§Sampled, not 100% tested.
Typ
Max
Unit
Condition
6
8
pF
VIN = 0.0 V
8
12
pF
VOUT = 0.0 V
Datasheet
49
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