ST72P314J2T View Datasheet(PDF) - STMicroelectronics

Part Name

Description

MFG CO.

ST72P314J2T

8-BIT MCU WITH SINGLE VOLTAGE FLASH MEMORY, ADC, 16-BIT TIMERS, SPI, SCI INTERFACES

STMicroelectronics 

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ST72334J/N, ST72314J/N, ST72124J

MEMORY AND PERIPHERAL CHARACTERISTICS (Cont’d)

ADC Analog to Digital Converter (8-bit)

Symbol

Parameter

Conditions

fADC

|TUE|

OE

GE

|DLE|

|ILE|

VAIN

IADC

tSTAB

tLOAD

Analog control frequency

Total unadjusted error 4)

Offset error 4)

Gain Error 4)

Differential linearity error 4)

Integral linearity error 4)

VDD=VDDA=5V

TA=25°C,VDD=VDDA=5V,3)

fCPU=8MHz,fADC=4MHz

Conversion range voltage

A/D conversion supply current

Stabilization time after ADC enable

Sample capacitor loading time

fCPU=8MHz, fADC=4MHz

VDD=VDDA=5V

tCONV Hold conversion time

RAIN

External input resistor

RADC Internal input resistor

CSAMPLE Sample capacitor

Min

-0.5

-0.5

VSSA

Typ 1)

1

1

4

2

8

1.5

6

Max

4 2)

1

0.5

0.5

0.5

0.5

VDDA

1

15 2)

Unit

MHz

LSB

V

mA

µs

µs

1/fADC

µs

1/fADC

kΩ

kΩ

pF

Notes:

1) Unless otherwise specified, typical data are based on TA=25°C and VDD-VSS=5V. They are given only as design guide-

lines and are not tested.

2) Data based on characterization results, not tested in production.

3) Tested in production at TA=25°C, characterized over the whole temperature range.

4) ADC Accuracy vs. Negative Injection Current:

For IINJ-=0.8mA, the typical leakage induced inside the die is 1.6µA and the effect on the ADC accuracy is a loss of 1 LSB

for each 10KΩ increase of the external analog source impedance. This effect on the ADC accuracy has been observed

under worst-case conditions for injection:

- negative injection

- injection to an Input with analog capability, adjacent to the enabled Analog Input

- at 5V VDD supply, and worst case temperature.

Digital Result ADCDR

255

254

253

1L S B i de a l

=

V----D-----D-----A-----–----V-----S----S----A----

256

(2)

7

TUE

(3)

6

5

OE

ILE

4

3

DLE

2

1

1 LSB (ideal)

GE

(1)

0

1234567

VSSA

253 254 255 256

VDDA

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

TUE=Total Unadjusted Error: maximum deviation

between the actual and the ideal transfer curves.

OE=Offset Error: deviation between the first actual

transition and the first ideal one.

GE=Gain Error: deviation between the last ideal

transition and the last actual one.

DLE=Differential Linearity Error: maximum devia-

tion between actual steps and the ideal one.

ILE=Integral Linearity Error: maximum deviation

between any actual transition and the end point

correlation line.

Vin (LSBideal)

116/125

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