BLF369 View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
MFG CO.
'BLF369' PDF : 17 Pages View PDF
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50 Ω
C30
R11 C29
C28
T3
B2
C31
T4
R12 C32
C33
+ VG1(test)
C24
R7
C23
C22
+ VD1(test)
C6
C5
C4
R5 R6
L2
L5
L1
C21 C20
C1
L6
R8 R9
C25
C26
R10
C27
L3
L4
C7
C8
C9
+ VG2(test)
+ VD2(test)
C12
C10 C11 R1 R2
T1
C2
T2
C3
B1
50 Ω
C13 C14 R3
R4
C15
001aae535
Fig 14. Class-AB common-source 225 MHz test circuit; VD1(test), VD2(test), VG1(test) and VG2(test) are drain and gate test voltages
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