LHF32KZ5 View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
'LHF32KZ5' PDF : 66 Pages View PDF
sharp
LHF32KZ5
40
Sym.
VCC=5V±0.5V, 5V±0.25V, TA=0°C to +70°C
Versions
VCC=5V±0.25V(4)
Parameter
Notes Min.
Max.
VCC=5V±0.5V(5)
Min.
Max.
Unit
tAVAV Read Cycle Time
tAVQV Address to Output Delay
tELQV BE# to Output Delay
2
tPHQV RP# High to Output Delay
tGLQV OE# to Output Delay
2
tELQX BE# to Output in Low Z
3
tEHQZ BE# High to Output in High Z
3
tGLQX OE# to Output in Low Z
3
tGHQZ OE# High to Output in High Z
3
tOH
Output Hold from Address, BE# or
OE# Change, Whichever Occurs First
3
70
80
ns
70
80
ns
70
80
ns
400
400
ns
35
35
ns
0
0
ns
25
30
ns
0
0
ns
10
10
ns
0
0
ns
tFLQV
tFHQV
BYTE# to Output Delay
3
70
80
ns
tFLQZ BYTE# to Output in High Z
3
25
30
ns
tELFL
tELFH
BE# Low to BYTE# High or Low
3
5
5
ns
NOTES:
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling edge of BE# without impact on tELQV.
3. Sampled, not 100% tested.
4. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard
Configuration) for testing characteristics.
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