Micron M25P16 Serial Flash Embedded Memory
Device Ordering Information
Table 26: Part Number Information Scheme (Continued)
Part Number
Category
Automotive Grade
Category Details
A = Automotive: –40°C to 85°C part. Device tested with high reliability test flow.
– = Standard: –40°C to 125°C.
Notes
Notes:
1. Secure options are available upon customer request.
2. Package is available only for products in the 110nm process technology.
3. Not for new designs. Use the MP package for new designs.
4. Micron recommends the use of the automotive grade device in the automotive environ-
ment, autograde 6 and grade 3.
5. Device grade 3 is available in an SO8 RoHS compliant package.
Note: The category of second Level Interconnect is marked on the package and on the
inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings re-
lated to soldering conditions are also marked on the inner box label.
Automotive Parts
Table 27: Part Number Example
Device
Type Density
M25P
16
Security
Features
–
Operating
Voltage
V
Part Number Category
Device Packing
Package Grade Option
MN
6
T
Plating
Technology Lithography
P
B
Automotive
Grade
A
Table 28: Part Number Information Scheme
Part Number
Category
Device type
Density
Security features
Operating voltage
Package
Device Grade
Packing Option
Plating technology
Category Details
M25P = Serial Flash memory for code storage
16 = 8Mb (2 Meg x 8)
– = no extra security
V = VCC = 2.7V to 3.6V
MN = SO8N (150 mils width)
MF = SO16W (300 mils width)
6 = Industrial temperature range: –40°C to 85°C. Device tested with high reliability test
flow.
3 = Automotive temperature range: –40°C to 125°C. Device tested with high reliability
test flow.
– = Tube
T = Tape and reel packing
Y = Tray
P = RoHS compliant
Notes
1
PDF: 09005aef8456656c
m25p16.pdf - Rev. J 1/18 EN
59
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