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SBPH400-3 View Datasheet(PDF) - STMicroelectronics

Part Name
Description
MFG CO.
SBPH400-3
ST-Microelectronics
STMicroelectronics ST-Microelectronics
'SBPH400-3' PDF : 43 Pages View PDF
SBPH400-3
Table 3.1
Pin name
SCLK
TPA1
TPA1#
TPB1
TPB1#
TPA2
TPA2#
TPB2
TPB2#
TPA3
TPA3#
TPB3
TPB3#
TPBIAS1
TPBIAS2
TPBIAS3
Pin description - normal operation (continued)
Pin number
60
1
2
3
4
7
8
9
10
16
17
18
19
5
11
20
I/O Description
O Clock to Link device - 49.152 MHz
I/O Positive signal of cable pair A of port 1
I/O Negative signal of cable pair A of port 1
I/O Positive signal of cable pair B of port 1
I/O Negative signal of cable pair B of port 1
I/O Positive signal of cable pair A of port 2
I/O Negative signal of cable pair A of port 2
I/O Positive signal of cable pair B of port 2
I/O Negative signal of cable pair B of port 2
I/O Positive signal of cable pair A of port 3
I/O Negative signal of cable pair A of port 3
I/O Positive signal of cable pair B of port 3
I/O Negative signal of cable pair B of port 3
O Cable Termination voltage source for port 1
O Cable Termination voltage source for port 2
O Cable Termination voltage source for port 3
Some pins on the SBPH400 have different functionality in various test modes. Table 3.2
identifies these pins for ease of reference, but the full description of the associate functions is
not included in this data sheet.
Table 3.2 Pin description - test pins
Pin name Pin number I/O Description
CLK98
PLLDIS
SCI[0:2]
35
49
76, 67, 65
I 98.304 MHz Oscillator input, used when PLLDIS is tied to VDD
I Internal PLL disable pin. Tie to VDD to disable internal PLL.
I Used to serially shift data into the SBPH400 for production test
SCO[0:2]
68, 66, 64 I Used to serially shift data out of the SBPH400 for production test
TCK
72
I Test clock. Used to clock data into and out of the SBPH400 during
operation of the Test Access Port or production test.
TDI
75
I Test Data Input. Used to serially shift test data and test instructions
into the SBPH400 during TAP operations.
TDO
63
O Test Data Output. Used to serially shift test data and test
instructions out of the SBPH400 during TAP operations.
TEST
ENABLE
70
I Reserved for production test
TESTMODE
30
I Reserved for production test
TMS
69
I Test Mode Select. This signal controls the state of the TAP
controller within the SBPH400.
TRST#
40
I Test Reset. Resets the TAP controller.
34/43
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