3
Test circuits
STL22N65M5
Test circuits
Figure 14. Test circuit for resistive load switching times
VGS
pulse width
VD
RG
RL
2200
3.3
+ μF
μF
VDD
D.U.T.
AM01468v1
Figure 16. Test circuit for inductive load switching and
diode recovery times
Figure 15. Test circuit for gate charge behavior
VGS
pulse width
+
2200
μF
1 kΩ
12 V
47 kΩ
100 nF
VDD
1 kΩ
IG= CONST
2.7 kΩ
47 kΩ
100 Ω
D.U.T.
VG
AM01469v1
Figure 17. Unclamped inductive load test circuit
A
D
G
D.U.T.
AA
fast
diode
100 µH
S
B
25 Ω
BB
D
3.3
µF
1000
+ µF
VDD
G
D.U.T.
+ RG
S
_
L
VD
2200
+ µF
3.3
µF
VDD
ID
Vi
pulse width
D.U.T.
AM01470v1
Figure 18. Unclamped inductive waveform
V(BR)DSS
VD
AM01471v1
Figure 19. Switching time waveform
ID
90%VDS
VDS
90%ID
VDD
IDM
ID
VDD
AM01472v1
VGS
90%VGS
10%VDS
VDS
td(V)
tr
tf
tc(off)
10%ID
ID
AM05540v2
DS9209 - Rev 4
page 8/17