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EVAL-ADUM4160EBZ View Datasheet(PDF) - Analog Devices

Part Name
Description
MFG CO.
EVAL-ADUM4160EBZ
ADI
Analog Devices ADI
'EVAL-ADUM4160EBZ' PDF : 16 Pages View PDF
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ADuM3160
Data Sheet
Parameter
For All Operating Modes
Common-Mode Transient Immunity
at Logic High Output4
Common-Mode Transient Immunity
at Logic Low Output4
Symbol Min
Typ
Max Unit Test Conditions/Comments1
|CMH|
25
35
|CML|
25
35
kV/µs
kV/µs
VUD+, VUD−, VDD+, VDD− = VDD1 or VDD2,
VCM = 1000 V, transient magnitude =
800 V
VUD+, VUD−, VDD+, VDD− = 0 V, VCM =
1000 V, transient magnitude = 800 V
1 CL = load capacitance, RL = test load resistance, VL = test load voltage, and VCM = common-mode voltage.
2 The supply current values are for the device running at a fixed continuous data rate 50% duty cycle, alternating J and K states. Supply current values are specified with
USB-compliant load present.
3 Propagation delay of DD+ to UD+ or DD− to UD− in either signal direction is measured from the 50% level of the rising or falling edge to the 50% level of the rising or
falling edge of the corresponding output signal.
4 CMH is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD2. CML is the maximum common-mode voltage slew rate
that can be sustained while maintaining VO < 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode voltage edges. The transient
magnitude is the range over which the common mode is slewed.
PACKAGE CHARACTERISTICS
Table 2.
Parameter
Resistance (Input to Output)1
Capacitance (Input to Output)1
Input Capacitance2
IC Junction-to-Ambient Thermal Resistance
Symbol Min
Typ
Max Unit Test Conditions/Comments
RI-O
1012
CI-O
2.2
pF
f = 1 MHz
CI
4.0
pF
θJA
45
°C/W Thermocouple located at center of
package underside
1 The device is considered a 2-terminal device; Pin 1 through Pin 8 are shorted together, and Pin 9 through Pin 16 are shorted together.
2 Input capacitance is from any input data pin to ground.
REGULATORY INFORMATION
The ADuM3160 has been approved by the organizations listed in Table 3. For more information about the recommended maximum
working voltages for specific cross-insulation waveforms and insulation levels, see Table 8 and the Insulation Lifetime section.
Table 3.
UL
Recognized under UL 1577 component
recognition program1
Single protection, 2500 V rms isolation
voltage
File E214100
CSA
Approved under CSA Component Acceptance Notice #5A
Basic insulation per CSA 60950-1-07 and IEC 60950-1,
600 V rms (849 V peak) maximum working voltage
File 205078
VDE
Certified according to DIN V VDE V
0884-10 (VDE V 0884-10):2006-122
Reinforced insulation, 560 V peak
File 2471900-4880-0001
1 In accordance with UL 1577, each ADuM3160 is proof tested by applying an insulation test voltage ≥ 3000 V rms for 1 sec (current leakage detection limit = 10 µA).
2 In accordance with DIN V VDE V 0884-10 (VDE V 0884-10):2006-12, each ADuM3160 is proof tested by applying an insulation test voltage ≥ 1050 V peak for 1 sec
(partial discharge detection limit = 5 pC). The asterisk (*) marking branded on the component indicates DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 approval.
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 4.
Parameter
Rated Dielectric Insulation Voltage
Minimum External Air Gap (Clearance)
Symbol Value
Unit
2500
V
L(I01) 8.0 min mm
Minimum External Tracking (Creepage)
L(I02) 7.7 min mm
Minimum Internal Gap (Internal Clearance)
Tracking Resistance (Comparative Tracking Index) CTI
Isolation Group
0.017 min mm
>175
V
IIIa
Test Conditions/Comments
1 minute duration
Measured from input terminals to output terminals,
shortest distance through air
Measured from input terminals to output terminals,
shortest distance path along body
Insulation distance through insulation
DIN IEC 112/VDE 0303, Part 1
Material Group (DIN VDE 0110, 1/89, Table 1)
Rev. C | Page 4 of 16
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