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IDT71L016L100PH View Datasheet(PDF) - Integrated Device Technology

Part Name
Description
MFG CO.
IDT71L016L100PH
IDT
Integrated Device Technology IDT
'IDT71L016L100PH' PDF : 8 Pages View PDF
1 2 3 4 5 6 7 8
IDT71L016
LOW POWER 3V CMOS STATIC RAM 1 MEG (64K x 16-BIT)
COMMERCIAL AND INDUSTRIAL TEMPERATURE RANGES
AC ELECTRICAL CHARACTERISTICS (VDD = 2.7 to 3.6V, All Temperature Ranges)
71L016L70
Symbol
Read Cycle
tRC
Parameter
Read Cycle Time
Min. Max.
70
tAA
Address Access Time
70
tACS
tCLZ(1)
tCHZ(1)
Chip Select Access Time
Chip Select Low to Output in Low-Z
Chip Select High to Output in High-Z
70
10
25
tOE
tOLZ(1)
tOHZ(1)
Output Enable Low to Output Valid
Output Enable Low to Output in Low-Z
Output Enable High to Output in High-Z
35
5
25
tOH
Output Hold from Address Change
10
tBE
tBLZ(1)
tBHZ(1)
Byte Enable Low to Output Valid
Byte Enable Low to Output in Low-Z
Byte Enable High to Output in High-Z
35
5
25
Write Cycle
tWC
Write Cycle Time
70
tAW
Address Valid to End of Write
65
tCW
Chip Select Low to End of Write
65
tBW
Byte Enable Low to End of Write
65
tAS
Address Set-up Time
0
tWR
Address Hold from End of Write
0
tWP
Write Pulse Width
55
tDW
Data Valid to End of Write
30
tDH
tOW(1)
tWHZ(1)
Data Hold Time
Write Enable High to Output in Low-Z
Write Enable Low to Output in High-Z
0
5
25
NOTE:
1. This parameter is guaranteed by device characterization, but is not production tested.
71L016L100
Min. Max. Units
100 — ns
— 100 ns
— 100 ns
10
— ns
30 ns
50 ns
5
— ns
30 ns
15
— ns
50 ns
5
— ns
30 ns
100 — ns
80
— ns
80
— ns
80
— ns
0
— ns
0
— ns
70
— ns
40
— ns
0
— ns
5
— ns
30 ns
3771 tbl 10
TIMING WAVEFORM OF READ CYCLE NO. 1(1,2,3)
ADDRESS
DATAOUT
tRC
tAA
tOH
PREVIOUS DATAOUT VALID
tOH
DATAOUT VALID
3771 drw 06
NOTES:
1. WE is HIGH for Read Cycle.
2. Device is continuously selected, CS is LOW.
3. OE, BHE, and BLE are LOW.
5
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