DC and AC parameters
M58BW016DT, M58BW016DB, M58BW016FT, M58BW016FB
Table 19. Asynchronous write and latch controlled write AC characteristics
Symbol
Parameter
Test condition
M58BW016
Unit
70
80
tAVLL Address Valid to Latch Enable Low
tAVWH Address Valid to Write Enable High
tDVWH Data Input Valid to Write Enable High
tELLL Chip Enable Low to Latch Enable Low
tELWL Chip Enable Low to Write Enable Low
tLHAX Latch Enable High to Address Transition
tLLLH Latch Enable Low to Latch Enable High
tLLWH latch Enable Low to Write Enable High
tQVVPL Output Valid to VPP Low
tVPHWH VPP High to Write Enable High
tWHAX Write Enable High to Address Transition
tWHDX Write Enable High to Input Transition
tWHEH Write Enable High to Chip Enable High
tWHGL Write Enable High to Output Enable Low
tWHQV Write Enable High to Output Valid
tWHWL Write Enable High to Write Enable Low
tWLWH Write Enable Low to Write Enable High
tQVPL Output Valid to Reset/Power-down Low
Min
0
0
ns
E = VIL
Min
50
50
ns
E = VIL
Min
50
50
ns
Min
0
0
ns
Min
0
0
ns
Min
5
5
ns
Min 10
10
ns
E = VIL
Min
50
50
ns
Min
0
0
ns
Min
0
0
ns
E = VIL
Min
0
E = VIL
Min
0
Min
0
0
ns
0
ns
0
ns
Min 150 150 ns
Min 175 175 ns
Min 20
20
ns
E = VIL
Min
60
60
ns
Min
0
0
ns
46/70