MPC5644B View Datasheet(PDF) - Freescale Semiconductor
Part Name
Description
MFG CO.
'MPC5644B' PDF : 114 Pages View PDF
4.10.3 Flash memory start-up/switch-off timings
Table 30. Start-up time/Switch-off time
Symbol
C
Parameter
Conditions1
Value
Unit
Min Typ Max
TFLARSTEXIT CC D Delay for flash memory module to exit Code flash
—
reset mode
memory
Data flash
memory
TFLALPEXIT CC T Delay for flash memory module to exit Code flash
—
low-power mode
memory
TFLAPDEXIT CC T Delay for flash memory module to exit Code flash
—
power-down mode
memory
Data flash
memory
TFLALPENTRY CC T Delay for flash memory module to enter Code flash
—
low-power mode
memory
1 VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified.
— — 125
——
— — 0.5
µs
— — 30
——
— — 0.5
4.11 Electromagnetic compatibility (EMC) characteristics
Susceptibility tests are performed on a sample basis during product characterization.
4.11.1 Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical application environment and simplified
MCU software. It should be noted that good EMC performance is highly dependent on the user application and the software in
particular.
Therefore it is recommended that the user apply EMC software optimization and pre-qualification tests in relation with the EMC
level requested for the application.
• Software recommendations The software flowchart must include the management of runaway conditions such as:
— Corrupted program counter
— Unexpected reset
— Critical data corruption (control registers)
• Pre-qualification trials Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the
software can be hardened to prevent unrecoverable errors occurring.
MPC5646C Microcontroller Data Sheet, Rev. 3
Freescale Semiconductor
Preliminary—Subject to Change Without Notice
63
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