MT28F320J3RG-12F View Datasheet(PDF) - Micron Technology

Part Name

Description

MFG CO.

MT28F320J3RG-12F

Q-FLASH™ MEMORY

Micron Technology 

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128Mb, 64Mb, 32Mb

Q-FLASH MEMORY

Figure 12

Transient Input/Output Reference Waveform for

VCCQ = 2.7V–3.6V, or VCCQ = 4.5V–5.5V

VCCQ

Input VCCQ/2

0.0

Test Points

VCCQ/2 Output

NOTE: AC test inputs are driven at VCCQ for a logic 1 and 0.0V for a logic 0. Input timing begins, and output timing ends, at VCCQ/

2V (50% of VCCQ). Input rise and fall times (10% to 90%) < 5ns.

Figure 13

Transient Equivalent Testing Load Circuit

1.3V

1N914

Device

Under Test

RL = 3.3KΩ

Out

CL

NOTE: C L includes jig capacitance

Test Configuration Capacitance Loading Value

Test Configuration

VCCQ = VCC = 2.7V to 3.6V

CL (pF)

30

VCCQ = 4.5V to 5.5V

30

128Mb, 64Mb, 32Mb Q-Flash Memory

MT28F640J3_7.p65 – Rev. 6, Pub. 8/02

42

Micron Technology, Inc., reserves the right to change products or specifications without notice.

©2002, Micron Technology, Inc.

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