SPC5607BECLLR View Datasheet(PDF) - Freescale Semiconductor
Part Name
Description
MFG CO.
'SPC5607BECLLR' PDF : 92 Pages View PDF
Electrical characteristics
Table 23. Flash module life
Symbol C
Parameter
Conditions
Value
Unit
Min
Typ
P/E CC C Number of program/erase cycles per
—
block for 16 Kbyte blocks over the
operating temperature range (TJ)
P/E CC C Number of program/erase cycles per
—
block for 32 Kbyte blocks over the
operating temperature range (TJ)
P/E CC C Number of program/erase cycles per
—
block for 128 Kbyte blocks over the
operating temperature range (TJ)
Retention CC C Minimum data retention at 85 °C
average ambient temperature2
Blocks with 0–1,000 P/E
cycles
100,000
— cycles
10,000 100,0001 cycles
1,000 100,0001 cycles
20
— years
Blocks with 10,000 P/E
cycles
10
— years
Blocks with 100,000 P/E
5
— years
cycles
1 To be confirmed
2 Ambient temperature averaged over duration of application, not to exceed recommended product operating
temperature range.
ECC circuitry provides correction of single bit faults and is used to improve further automotive reliability results. Some units
will experience single bit corrections throughout the life of the product with no impact to product reliability.
Table 24. Flash read access timing
Symbol
C
Parameter Conditions1
Max
fREAD
CC
P
Maximum
2 wait states
64
frequency for
C
Flash reading 1 wait state
40
C
0 wait states
20
1 VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified
Unit
MHz
3.10.2 Flash power supply DC characteristics
Table 25 shows the power supply DC characteristics on external supply.
MPC5607B Microcontroller Data Sheet, Rev. 3
38
Freescale Semiconductor
Preliminary—Subject to Change Without Notice
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