ST7LITE0xY0, ST7LITESxY0
13.8 I/O PORT PIN CHARACTERISTICS
13.8.1 General Characteristics
Subject to general operating conditions for VDD, fOSC, and TA unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIL Input low level voltage
VIH Input high level voltage
Vhys
Schmitt trigger voltage
hysteresis 1)
IL
Input leakage current
VSS≤VIN≤VDD
IS
Static current consumption induced by
each floating input pin2)
Floating input mode
VSS - 0.3
0.7xVDD
0.3xVDD
V
VDD + 0.3
400
mV
±1
µA
400
RPU Weak pull-up equivalent resistor3)
VIN=V VDD=5V
SS
VDD=3V
50
120
250
kΩ
160
CIO I/O pin capacitance
5
tf(IO)out Output high to low level fall time 1)
CL=50pF
25
tr(IO)out Output low to high level rise time 1)
Between 10% and 90%
25
tw(IT)in External interrupt pulse time 4)
1
pF
ns
tCPU
Notes:
1. Data based on characterization results, not tested in production.
2. Configuration not recommended, all unused pins must be kept at a fixed voltage: using the output mode of the I/O for
example or an external pull-up or pull-down resistor (see Figure 66). Static peak current value taken at a fixed VIN value,
based on design simulation and technology characteristics, not tested in production. This value depends on VDD and tem-
perature values.
3. The RPU pull-up equivalent resistor is based on a resistive transistor (corresponding IPU current characteristics de-
scribed in Figure 63).
4. To generate an external interrupt, a minimum pulse width has to be applied on an I/O port pin configured as an external
interrupt source.
Figure 62. Two typical applications with unused I/O pin configured as input
VDD
10kΩ
ST7XXX
UNUSED I/O PORT
10kΩ
UNUSED I/O PORT
ST7XXX
Caution: During normal operation the ICCCLK pin must be pulled- up, internally or externally
(external pull-up of 10k mandatory in noisy environment). This is to avoid entering ICC mode unexpectedly during a reset.
Note: I/O can be left unconnected if it is configured as output (0 or 1) by the software. This has the advantage of greater EMC
robustness and lower cost.
Figure 63. Typical IPU vs. VDD with VIN=VSS
l
90
80
Ta= 1 40°C
Ta= 9 5°C
70
Ta= 2 5°C
60
Ta= -45 °C
50
TO BE CHARACTERIZED
40
30
20
10
0
2 2.5 3 3.5 4 4.5 5 5.5 6
V dd (V )
95/124
1