ST7FLITE02Y1B6 View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
ST7FLITE02Y1B6
STMicroelectronics
'ST7FLITE02Y1B6' PDF : 124 Pages View PDF
ST7LITE0xY0, ST7LITESxY0
I/O PORT PIN CHARACTERISTICS (Cont’d)
13.8.2 Output Driving Current
Subject to general operating conditions for VDD, fCPU, and TA unless otherwise specified.
Symbol
Parameter
Conditions
Min
Max
Unit
VOL 1)
Output low level voltage for a standard I/O pin
when 8 pins are sunk at same time
(see Figure 65)
Output low level voltage for a high sink I/O pin
when 4 pins are sunk at same time
(see Figure 66)
VOH 2)
Output high level voltage for an I/O pin
when 4 pins are sourced at same time
(see Figure 72)
VOL 1)3)
Output low level voltage for a standard I/O pin
when 8 pins are sunk at same time
(see Figure 64)
Output low level voltage for a high sink I/O pin
when 4 pins are sunk at same time
VOH 2)3)
Output high level voltage for an I/O pin
when 4 pins are sourced at same time
VOL 1)3)
Output low level voltage for a standard I/O pin
when 8 pins are sunk at same time
Output low level voltage for a high sink I/O pin
when 4 pins are sunk at same time
Output high level voltage for an I/O pin
VOH 2)3) when 4 pins are sourced at same time
(see Figure 69)
IIO=+5mA TA≤85°C
TA≥85°C
IIO=+2mA TA≤85°C
TA≥85°C
IIO=+20mA, TA≤85°C
TA≥85°C
IIO=+8mA TA≤85°C
TA≥85°C
IIO=-5mA, TA≤85°C
TA≥85°C
IIO=-2mA TA≤85°C
TA≥85°C
VDD-1.5
VDD-1.6
VDD-0.8
VDD-1.0
1.0
1.2
0.4
0.5
1.3
1.5
0.75
0.85
IIO=+2mA TA≤85°C
TA≥85°C
0.5
V
0.6
IIO=+8mA TA≤85°C
0.5
TA≥85°C
0.6
IIO=-2mA TA≤85°C VDD-0.8
TA≥85°C VDD-1.0
IIO=+2mA TA≤85°C
0.6
TA≥85°C
0.7
IIO=+8mA TA≤85°C
0.6
TA≥85°C
0.7
IIO=-2mA TA≤85°C VDD-0.9
TA≥85°C VDD-1.0
Notes:
1. The IIO current sunk must always respect the absolute maximum rating specified in Section 13.2.2 and the sum of IIO
(I/O ports and control pins) must not exceed IVSS.
2. The IIO current sourced must always respect the absolute maximum rating specified in Section 13.2.2 and the sum of
IIO (I/O ports and control pins) must not exceed IVDD.
3. Not tested in production, based on characterization results.
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