LH28F008SC View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
'LH28F008SC' PDF : 38 Pages View PDF
LH28F008SC
8M (1M × 8) Flash Memory
Capacitance
TA = +25°C, f = 1 MHz
SYMBOL
PARAMETER
CIN
COUT
Input Capacitance
Output Capacitance
NOTE:
1. Sampled, not 100% tested.
TYP.
6
8
MAX. UNITS CONDITIONS
8
pF VIN = 0.0 V
12
pF VOUT = 0.0 V
AC INPUT/OUTPUT TEST CONDITIONS
3.0
INPUT 1.5
0.0
TEST POINTS
1.5 OUTPUT
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1' and 0.0 V for a
Logic '0'. Input timing begins and output timing ends at 1.5 V.
Input rise and fall times (10% to 90%) < 10 ns.
28F008SC-12
Figure 12. Transient Input/Output Reference
Waveform for VCC = 3.3 V ±0.3 V and VCC = 5 V ±5%
(High Speed Testing Configuration)
1.3 V
1N914
DEVICE
UNDER
TEST
RL = 3.3 kΩ
OUT
CL
2.4
2.0
INPUT
TEST POINTS
0.45
0.8
2.0
OUTPUT
0.8
NOTE:
AC test inputs are driven at VOH (2.4 VTTL) for a Logic '1' and VOL
(0.45 VTTL) for a Logic '0'. Input timing begins at VIH (2.0 VTTL)
and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise
and fall times (10% to 90%) < 10 ns.
28F008SC-13
Figure 13. Transient Input/Output Reference
Waveform for VCC = 5 V ±10%
(Standard Testing Configuration)
NOTE: CL Includes Jig Capacitance
28F008SC-14
Figure 14. Transient Equivalent
Testing Load Circuit
Test Configuration Capacitance
Loading Value
TEST CONFIGURATION
VCC = 3.3 V ± 0.3 V
VCC = 5 V ± 0.5%
VCC = 5 V ± 10%
CL (pF)
50
30
100
22
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